Selfie

COMIO Smartphone Introduces The Intruder Selfie Feature

COMIO India presents a unique security smartphone feature , The Intruder Selfie. Available across the entire smartphone range, the feature is a blessing in disguise for everyone looking to up their privacy.

Don’t we all hate nosy people? Be it a jealous partner, an inquisitive colleague, a notorious sibling. Think somebody has quickly looked at your phone while you weren’t paying attention? Don’t worry! With this feature, COMIO smartphones have come to your rescue. All COMIO devices come with a cool Intruder Selfie feature. Here’s how and why it is so cool. Do you feel sorted after setting a ‘Lock’ pattern or pin to your smartphone? But is that secure enough?

If any intruder, i.e. unauthorized user, tries to break into a COMIO Smartphone, this feature enables the phone to click their picture automatically. Once the COMIO users re-access their phone, the same picture will be displayed to them, revealing them the intruder’s identity. Amazing, right? Now that’s what we call true privacy. It promises to be a welcome feature for many situations, as the video below demonstrates in a fun way. Link to the video- COMIO Intruder Selfie.

Mr. Sanjay Kumar Kalirona, CEO and Director, COMIO India said, “An individual’s smartphone is a window to all their personal details, be it their passwords, bank details or a plethora of personal pictures. Keeping all this data secure extremely important. Hence, the Intruder Selfie is designed to not only keep your smartphone protected but instead is a step ahead, in helping you identify the person trying to breach your trust!”

COMIO smartphones are big on privacy and security. Apart from the Intruder Selfie they also come pre-loaded with the valuable anti-theft feature. In case of any suspicious activity, SIM based alerts are shared with the registered mobile number. Other options include the lock and unlock feature, shutdown blocker, data back up, and SIM related functions.

Leave a Reply

Your email address will not be published. Required fields are marked *